Integrated Design of a Compact Ka-Band One-Port Vector Reflectometer
Abstract
In this paper, an integrated design of a compact one-port vector millimeter wave reflectometer or network analyzer (VNA), operating in the Ka-band (26.5-40 GHz) frequency range is presented. The design follows that of a recently-developed VNA, but with the goal of incorporating its critical components into one integrated system so as to make it smaller, improve its measurement accuracy and source stability, while incorporating on-board control and data collection approach. The most critical high-frequency component of this design is an electronically-controlled phase shifter, designed using sub-resonant PIN diode-loaded slots incorporated in the broad wall of a rectangular waveguide. Using a non-uniform spacing scheme used in the placement of the slots is shown to significantly reduce unwanted resonances. In addition, slot-coupled rectangular waveguide-tee configuration is used for the standing-wave probe section of this reflectometer which is incorporated into the phase shifter on the same high-frequency printed circuit board (PCB). Finally, this new design provides the possibility of using a more accurate three-port S-parameters characterization instead of a two-port characterization. The design foundation and some results of extensive simulations are shown in this paper.
Recommended Citation
M. B. Fallahpour et al., "Integrated Design of a Compact Ka-Band One-Port Vector Reflectometer," Proceedings of the IEEE International Instrumentation and Measurement Technology Conference (2011, Binjiang, Hangzhou, China), pp. 154 - 158, Institute of Electrical and Electronics Engineers (IEEE), May 2011.
The definitive version is available at https://doi.org/10.1109/IMTC.2011.5944200
Meeting Name
IEEE International Instrumentation and Measurement Technology Conference (2011: May 10-12, Binjiang, Hangzhou, China)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Phase Shifter; Standing-Wave Probe; Sub-Resonant Slots; Vector Netwrok Analyzer; Critical Component; Data Collection; Extensive Simulations; Frequency Ranges; High Frequency Components; High Frequency HF; Integrated Designs; Integrated Systems; Ka Band; Measurement Accuracy; New Design; Non-Uniform Spacing; OR-Networks; Control System Stability; Electric Network Analysis; Semiconductor Diodes
International Standard Book Number (ISBN)
978-1424479351
International Standard Serial Number (ISSN)
1091-5281
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2011 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 May 2011
