Image Distortion Characterization Due to Equivalent Monostatic Approximation in Near Field Bistatic SAR Imaging
Abstract
The ω-k synthetic aperture radar (SAR) algorithm is a computationally efficient algorithm for near field three-dimensional (3D) monostatic SAR imaging in nondestructive testing applications. However, bistatic measurements are preferred in order to obtain high dynamic range, in particular when real-time imaging arrays are used. This paper investigates the image distortion caused by using an equivalent monostatic imaging algorithm for bistatic measurements. Simulation and measurement at millimeter wave frequencies in Ka-band (26.5-40 GHz) are used to investigate the resultant image distortion. Further, the image distortion is quantified through root-mean-square (RMS) error which is calculated as a function of bistatic transmitter-receiver separation distance, range and noise power.
Recommended Citation
Z. Manzoor et al., "Image Distortion Characterization Due to Equivalent Monostatic Approximation in Near Field Bistatic SAR Imaging," Proceedings of the IEEE International Instrumentation and Measurement Technology Conference (2017, Politecnico di TorinoTorino, Italy), Institute of Electrical and Electronics Engineers (IEEE), May 2017.
The definitive version is available at https://doi.org/10.1109/I2MTC.2017.7969810
Meeting Name
IEEE International Instrumentation and Measurement Technology Conference (2017: May 22-25, Politecnico di TorinoTorino, Italy)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Bistatic Imaging Configuration; Equivalent Monostatic Model; Image Error; SAR Imaging; Millimeter Waves; Nondestructive Examination; Optical Bistability; Synthetic Aperture Radar; Computationally Efficient; Imaging Configurations; Monostatic; Root-Mean-Square Errors; Simulations And Measurements; Radar Imaging
International Standard Book Number (ISBN)
978-1-5090-3596-0
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2017 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 May 2017