A New Dual-Loaded Aperture Probe for Near-Field Millimeter Wave Imaging
Abstract
Millimeter wave differential probes have demonstrated great potential for high-resolution near-field imaging and detection of small and low scattering targets. There are several differential probe designs that already exist each with own advantages and disadvantages. An alternative design, using switchable loaded elliptical slot antennas placed on a standard waveguide aperture is proposed. The proposed probe provides higher image resolution in a much smaller form factor (i.e., overall size). This design is compared to prior designs of differential probes through simulation and measurements.
Recommended Citation
K. R. Brinker et al., "A New Dual-Loaded Aperture Probe for Near-Field Millimeter Wave Imaging," Proceedings of the IEEE International Instrumentation and Measurement Technology Conference (2017, Politecnico di TorinoTorino, Italy), Institute of Electrical and Electronics Engineers (IEEE), Jul 2017.
The definitive version is available at https://doi.org/10.1109/I2MTC.2017.7969809
Meeting Name
IEEE International Instrumentation and Measurement Technology Conference (2017: May 22-25, Politecnico di TorinoTorino, Italy)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Differential Probe; Loaded Aperture; Millimeter Wave; Near-Field; Nondestructive Testing
International Standard Book Number (ISBN)
978-1509035960
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2017 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jul 2017
