Development of Simple Physics-Based Circuit Macromodel from PEEC

Abstract

The evaluation of electromagnetic parasitics is important for electromagnetic interference within power electronics systems. Simple yet accurate physics-based lumped-circuit models of these parasitics can facilitate fast analysis and better understanding of the system performance. Methods exist to reduce complex electromagnetic models to much simpler representations but, while they speed up calculation, they do not preserve physicality. In this paper, a methodology is developed for obtaining a simplified SPICE circuit from a large-scale partial element equivalent circuit (PEEC) model, where there is a clear correlation between geometry and parasitic circuit elements. To preserve correlation between equivalent circuits and physical geometry, reduction is done first for inductance and resistance; then, reduction is performed for capacitance using nodes from the reduced LR model. The reduced model gives a better insight into the causes of and possible solutions to electromagnetic problems and can be used to improve the design. The method was validated on real power electronics geometries using frequency-dependent behavior of port impedances and admittances. The initial PEEC model for this example contained approximately 10 645 unknowns and was reduced to 195 elements. The calculated and measured impedances agree within 0.1 dB up to 200 MHz.

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Circuit simulation; Electromagnetic pulse; Equivalent circuits; Geometry; Lumped parameter networks; Power electronics; Reconfigurable hardware; SPICE; Circuit macromodel; Electromagnetic models; Electromagnetic problems; Frequency dependent; Lumped circuit models; Parasitic circuit elements; Partial element equivalent circuit model; Power electronics systems; Electric network analysis; Electromagnetic interference (EMI); parameter estimation

International Standard Serial Number (ISSN)

0018-9375

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Oct 2016

Link to Full Text

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