Optical Tracking Based EM-Field Probing System for EMC Near Field Manual Scanning
This paper introduces a method to visualize the frequency dependent electromagnetic field distribution on complex shaped electronic systems. This is achieved by combining magnetic field probing with an optical tracking system for automatically recording the probe position and orientation. Due to the complexity of the shape of the electronic systems of interest, and for utilizing the expertise of the user, the probe will be moved by manually instead of robotically. With the location from the optical tracking system, 3D near field strength map can be obtained at real time during near field manual scanning.
H. He et al., "Optical Tracking Based EM-Field Probing System for EMC Near Field Manual Scanning," Proceedings of the 2014 IEEE International Symposium on Electromagnetic Compatibility (2014, Raleigh, NC), vol. 2014-September, no. September, pp. 697-701, Institute of Electrical and Electronics Engineers (IEEE), Sep 2014.
The definitive version is available at https://doi.org/10.1109/ISEMC.2014.6899058
2014 IEEE International Symposium on Electromagnetic Compatibility (2014: Aug. 3-8, Raleigh, NC)
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Electromagnetic field distribution; Frequency dependent; manual scan; Near fields; Near-field scanning; Optical tracking; Optical tracking systems; Probe position and orientations; Electromagnetic fields; Probes; Scanning; Tracking (position); Electromagnetic compatibility; near field visualization
International Standard Serial Number (ISSN)
Article - Conference proceedings
© 2014 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Sep 2014