Optical Tracking Based EM-Field Probing System for EMC Near Field Manual Scanning

Abstract

This paper introduces a method to visualize the frequency dependent electromagnetic field distribution on complex shaped electronic systems. This is achieved by combining magnetic field probing with an optical tracking system for automatically recording the probe position and orientation. Due to the complexity of the shape of the electronic systems of interest, and for utilizing the expertise of the user, the probe will be moved by manually instead of robotically. With the location from the optical tracking system, 3D near field strength map can be obtained at real time during near field manual scanning.

Meeting Name

2014 IEEE International Symposium on Electromagnetic Compatibility (2014: Aug. 3-8, Raleigh, NC)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Electromagnetic field distribution; Frequency dependent; manual scan; Near fields; Near-field scanning; Optical tracking; Optical tracking systems; Probe position and orientations; Electromagnetic fields; Probes; Scanning; Tracking (position); Electromagnetic compatibility; near field visualization

International Standard Serial Number (ISSN)

1077-4076

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2014 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Sep 2014

Link to Full Text

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