Application of Emission Source Microscopy Technique to EMI Source Localization above 5 GHz
This paper presents the utilization of the emission source microscopy (ESM) technique to localize active sources of radiation on a PCB. For complex and large systems with multiple sources, localizing the sources of radiation often proves difficult. Near-field scanning provides limited information about the components contributing to far-field radiation. Two-dimensional synthetic aperture radar, a well-known technique used to diagnose and align phase array antennas, is adapted as emission source microscopy and utilized here for this alternative application. This paper presents the source localization methodology, along with simulation and measurement results. The results show that the proposed method can detect multiple active sources on a complex PCB.
P. Maheshwari et al., "Application of Emission Source Microscopy Technique to EMI Source Localization above 5 GHz," Proceedings of the 2014 IEEE International Symposium on Electromagnetic Compatibility (2014, Raleigh, NC), vol. 2014-September, no. September, pp. 7-11, Institute of Electrical and Electronics Engineers (IEEE), Sep 2014.
The definitive version is available at https://doi.org/10.1109/ISEMC.2014.6898933
2014 IEEE International Symposium on Electromagnetic Compatibility (2014: Aug. 3-8, Raleigh, NC)
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Antenna arrays; Antenna phased arrays; Polychlorinated biphenyls; Synthetic aperture radar; EMI; Emission sources; Near-field scanning; SAR; Source localization; Electromagnetic compatibility; emission source microscopy
International Standard Serial Number (ISSN)
Article - Conference proceedings
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01 Sep 2014