Application of Emission Source Microscopy Technique to EMI Source Localization above 5 GHz

Abstract

This paper presents the utilization of the emission source microscopy (ESM) technique to localize active sources of radiation on a PCB. For complex and large systems with multiple sources, localizing the sources of radiation often proves difficult. Near-field scanning provides limited information about the components contributing to far-field radiation. Two-dimensional synthetic aperture radar, a well-known technique used to diagnose and align phase array antennas, is adapted as emission source microscopy and utilized here for this alternative application. This paper presents the source localization methodology, along with simulation and measurement results. The results show that the proposed method can detect multiple active sources on a complex PCB.

Meeting Name

2014 IEEE International Symposium on Electromagnetic Compatibility (2014: Aug. 3-8, Raleigh, NC)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Antenna arrays; Antenna phased arrays; Polychlorinated biphenyls; Synthetic aperture radar; EMI; Emission sources; Near-field scanning; SAR; Source localization; Electromagnetic compatibility; emission source microscopy

International Standard Serial Number (ISSN)

1077-4076

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2014 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Sep 2014

Link to Full Text

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