A Methodology to Generate a Time-Varying Adjustable Wave Impedance inside a TEM Cell

Abstract

A methodology to generate a time-varying adjustable wave impedances inside a TEM cell is introduced for electromagnetic susceptibility tests of small electronic modules. The TEM cell is excited by two amplified arbitrary waveforms. By varying the excitation waveforms and their timing, the momentary wave impedance and field strength inside the TEM cell can be adjusted.

Meeting Name

2014 IEEE International Symposium on Electromagnetic Compatibility (2014: Aug. 3-8, Raleigh, NC)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Broadband amplifiers; Cells; Cytology; Magnetic susceptibility; Arbitrary waveform; Electromagnetic susceptibilities; Electronic modules; Field strengths; Susceptibility tests; TEM cell; Time varying; Wave impedances; Electromagnetic compatibility

International Standard Serial Number (ISSN)

1077-4076

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2014 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Sep 2014

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