Prediction of Electrostatic Discharge (ESD) Soft Error on Two-Way Radio using ESD Simulation in CST and ESD Immunity Scanning Technique

Abstract

Electrostatic Discharge (ESD) can cause ESD soft error failures such as radio reset. In this paper, a new methodology is developed to assess ESD risk at system level prior to PCB fabrication using 3D simulation. A Poynting vector theorem is used to calculate the accumulated incident power received by the sensitive IC which is identified through ESD immunity scanning test. The time-weighted-Average peak power is to establish the criteria for ESD risk causing the soft error failure. Results from this paper will help electrical engineer to predict potential ESD reset failure at system level instead of the previously trial-And-error procedure.

Meeting Name

36th IEEE International Electronics Manufacturing Technology Conference (2014: Nov. 11-13, Johor, Malaysia)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Electromagnetic waves; Electrostatic discharge; Electrostatics; Errors; Industrial electronics; Manufacture; Outages; Printed circuit boards; Radiation hardening; Risk assessment; 3D simulations; Incident power; PCB fabrication; Poynting vectors; Scanning techniques; Time-weighted averages; Trial-and-error procedures; Two-way radio; Electrostatic devices

International Standard Book Number (ISBN)

978-147998209-7

International Standard Serial Number (ISSN)

1089-8190

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2015 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Jun 2015

Link to Full Text

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