Far-Field Radiation Estimation from Near-Field Measurements and Image Theory
Abstract
This paper proposed a near-field to far-field transformation method for the radiation sources located on a large ground plane, based on the Huygens's principle and image theory. This method uses the tangential electromagnetic fields on a small near-field plane and the vertical electric fields, one tangential component (parallel to the ground plane) of magnetic fields around the near-field plane to extract the equivalent current sources. The far-field radiations are calculated from these equivalent sources and their images. The application of this method in several simulation models indicates that it has very good performance on both simple printed circuit boards and antenna radiation estimation. The method proposed in this paper can decrease the total scanning area in real measurements. .
Recommended Citation
J. Pan et al., "Far-Field Radiation Estimation from Near-Field Measurements and Image Theory," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2014, Raleigh, NC), pp. 609 - 614, Institute of Electrical and Electronics Engineers (IEEE), Aug 2014.
The definitive version is available at https://doi.org/10.1109/ISEMC.2014.6899043
Meeting Name
2014 IEEE International Symposium on Electromagnetic Compatibility (2014: Aug. 4-8, Raleigh, NC)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Center for High Performance Computing Research
Second Research Center/Lab
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Antenna radiation; Electric fields; Electromagnetic fields; Microstrip antennas; Printed circuit boards; Printed circuits; Equivalent currents; Far-field radiation; Huygens; Image theory; Near field to far field transformations; Near-field measurement; Tangential components; Vertical electric fields; Electromagnetic compatibility; Huygens's principle
International Standard Serial Number (ISSN)
1077-4076
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2014 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
08 Aug 2014