Design Criteria and Error Sensitivity of Time-Domain Channel Characterization (TCC) for Asymmetry Fixture De-Embedding
Abstract
Time-domain channel characterization (TCC) for de-embedding of an asymmetric fixture is introduced. Two design criteria for the design of a 2x-thru are proposed. Error sensitivity regarding a small error in the S-parameters of the 1x-fixture is analyzed with an insertion loss error-coefficient and a return loss error-coefficient. The TCC procedure, including proposed design criteria and error sensitivity, is also introduced to reduce the error in the TCC application. Three different 2x-thru structures are investigated for the verification of the two proposed design criteria and analyzed for error sensitivity. Test fixtures on a printed circuit boards are fabricated for the experimental verification.
Recommended Citation
C. Yoon et al., "Design Criteria and Error Sensitivity of Time-Domain Channel Characterization (TCC) for Asymmetry Fixture De-Embedding," IEEE Transactions on Electromagnetic Compatibility, vol. 57, no. 4, pp. 836 - 846, Institute of Electrical and Electronics Engineers (IEEE), Aug 2015.
The definitive version is available at https://doi.org/10.1109/TEMC.2014.2379627
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Center for High Performance Computing Research
Second Research Center/Lab
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Design; Fixtures (tooling); Printed circuit boards; Printed circuits; Scattering parameters; Channel characterization; De-embedding; Design criteria; Error coefficient; Error sensitivity; Experimental verification; Return loss; Test fixture; Errors
International Standard Serial Number (ISSN)
0018-9375
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2015 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2015