Abstract
Near-field scanning has often been used to measure and characterize magnetic fields surrounding individual integrated circuits (IC) and high speed digital electronic circuits. The paper describes the use of near-field scanning data, performed in a typical laboratory bench top environment, to predict radiated electromagnetic interference (EMI) in a typical product environment. The product environment may include enclosures and apertures. The approach begins by acquiring sufficient near-field scanning data to allow representation of an unintentional radiating source by an equivalent surface current distribution. The equivalent current distribution is used as a source in numerical full wave modeling. The agreement between direct full wave simulation results and full wave simulation results using equivalent sources works well under certain assumptions.
Recommended Citation
J. Shi et al., "using Near-Field Scanning to Predict Radiated Fields," Proceedings of the InternationalSymposium on Electromagnetic Compatibility, 2004, Institute of Electrical and Electronics Engineers (IEEE), Jan 2004.
The definitive version is available at https://doi.org/10.1109/ISEMC.2004.1349988
Meeting Name
InternationalSymposium on Electromagnetic Compatibility, 2004
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
EMI; FDTD; Apertures; Current Distribution; Electromagnetic Interference; Enclosures; Equivalent Current Distribution; Finite Difference Time-Domain Analysis; High Speed Digital Electronic Circuits; Integrated Circuits; Magnetic Field Measurement; Near-Field Scanning; Radiated Field Prediction
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2004 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jan 2004
