Abstract
In this paper, a new architecture of distributed embedded memory cores for SoC is proposed and an effective memory repair method by using the proposed Spare Line Borrowing (software-driven reconfiguration) technique is investigated. It is known that faulty cells in memory core show spatial locality, also known as fault clustering. This physical phenomenon tends to occur more often as deep submicron technology advances due to defects that span multiple circuit elements and sophisticated circuit design. The combination of new architecture & repair method proposed in this paper ensures fault tolerance enhancement in SoC, especially in case of fault clustering. This fault tolerance enhancement is obtained through optimal redundancy utilization: Spare redundancy in a fault-resistant memory core is used to fix the fault in a fault-prone memory core. The effect of Spare Line Borrowing technique on the reliability of distributed memory cores is analyzed through modeling and extensive parametic simulation.
Recommended Citation
B. Jang et al., "Spare Line Borrowing Technique for Distributed Memory Cores in SoC," Proceedings of the IEEE Instrumentation and Measurement Technology Conference (2005, Ottawa, Canada), vol. 1, pp. 43 - 48, Institute of Electrical and Electronics Engineers (IEEE), May 2005.
The definitive version is available at https://doi.org/10.1109/IMTC.2005.1604065
Meeting Name
IEEE Instrumentation and Measurement Technology Conference: IMTC (2005: May 16-19, Ottawa, Canada)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Memory Repair; Reconfiguration; System-On-A-Chip (SoC); Spare Line Borrowing Technique; Computer Architecture; Computer Software; Distributed Computer Systems; Fault Tolerant Computer Systems; Storage Allocation (Computer); Embedded Systems
International Standard Book Number (ISBN)
978-0780388796
International Standard Serial Number (ISSN)
1091-5281
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2005 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 May 2005