Abstract
This paper provides an approach for predicting the effects of skew and imbalance on radiated emission of cables inside a commercial 19-inch rack-based cabinet. Scattering parameters (S-parameters) for two sets of cable assembly are measured with a four-port vector network analyzer (VNA) and converted into mixed mode S-parameters. Time-domain input signals with different slew rates and different amount of skew are transferred into frequency-domain using fast Fourier transform (FFT). The spectra of radiation emission associated with different inputs are then estimated.
Recommended Citation
J. Chen et al., "Predictive Modeling of the Effects of Skew and Imbalance on Radiated EMI from Cables," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2007, Honolulu, HI), Institute of Electrical and Electronics Engineers (IEEE), Jul 2007.
The definitive version is available at https://doi.org/10.1109/ISEMC.2007.234
Meeting Name
IEEE International Symposium on Electromagnetic Compatibility (2007: Jul. 9-13, Honolulu, HI)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Electromagnetic Interference; S-Parameters; Fast Fourier Transforms; Frequency Spectra; Frequency-Domain Analysis; Mixed Mode Scattering Parameters; Radiation Prediction; Time-Domain Analysis; Vector Network Analyzer; Scattering Parameters; Skew; Slew Rate; Cable Assemblies; Fast Fourier Transform (FFT); Frequency Domains; Input Signals; International Symposium; Mixed Modes; Predictive Modeling; Radiated Emission; Radiation Emissions; Slew Rates; Time Domains; Cables; Electric Inverters; Electric Network Analysis; Electromagnetic Compatibility; Electromagnetic Pulse; Electromagnetism; Emission Spectroscopy; Fourier Transforms; Plastic Molds; Technical Presentations; Electric Network Analyzers
International Standard Book Number (ISBN)
1424413494
International Standard Serial Number (ISSN)
2158-110X; 2158-1118
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2007 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jul 2007
