Abstract
Fatigue and stress induced surface crack detection in metals is an important practical issue. A newly developed microwave inspection approach, using an open-ended rectangular waveguide, has proved to be an effective tool for detecting such cracks. This novel microwave approach overcomes some of the limitations associated with the standard detection methods for surface crack detection. In addition, this approach is applicable to exposed, filled (with a dielectric such as dirt, rust, etc.) and cracks under dielectric coatings such as paint. This paper presents the basic foundation of this surface crack detection methodology along with the ways by which measurement parameters may be optimized for increased detection sensitivity.
Recommended Citation
R. Zoughi et al., "Measurement Parameter Optimization for Surface Crack Detection in Metals using an Open-Ended Waveguide Probe," Proceedings of the Joint IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee (1996, Brussels, Belgium), vol. 2, pp. 1391 - 1394, Institute of Electrical and Electronics Engineers (IEEE), Jun 1996.
The definitive version is available at https://doi.org/10.1109/IMTC.1996.507600
Meeting Name
Joint IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee (1996: Jun. 4-6, Brussels, Belgium)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Al; Covered Cracks; Crack Detection; Detection Sensitivity; Dielectrics; Dirt; Electric Sensing Devices; Fatigue; Filled Cracks; Inspection; Measurement Parameter Optimization; Metals; Microwave Inspection; Microwave Measurement; Nondestructive Testing; Open-Ended Rectangular Waveguide; Open-Ended Waveguide Probe; Optimisation; Probes; Rust; Steel; Stress; Surface Crack Detection; Waveguide Components
International Standard Book Number (ISBN)
780333128
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 1996 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jun 1996