Developing a Universal Exchange Format for Near-Field Scan Data

Author

John Shepherd
Atsushi Nakamura
Frederic Lafon
Etienne Sicard
Mohamed Ramdani
David Pommerenke, Missouri University of Science and TechnologyFollow
Giorgi Muchaidze
Sebastien Serpaud

Recommended Citation

J. Shepherd et al., "Developing a Universal Exchange Format for Near-Field Scan Data," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility 2009 (2009, Austin, TX), Institute of Electrical and Electronics Engineers (IEEE), Aug 2009.

Meeting Name

IEEE International Symposium on Electromagnetic Compatibility, EMC 2009 (2009: Aug. 17-21, Austin, TX)

Department(s)

Electrical and Computer Engineering

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2009 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

21 Aug 2009