Abstract
The Space Shuttle Columbia's catastrophic failure is thought to have been caused by a dislodged piece of external tank spray on foam insulation (SOFI) striking and significantly damaging the left wing of the orbiter, which may have been due to a flawed section of SOFI. Microwave and millimeter wave nondestructive evaluation (NDE) methods have shown great potential detecting anomalies in SOFI such as small air voids using a horn and lens in a (real) focused configuration. Synthetic focusing methods may also be used to detect air voids in SOFI and may additionally offer the ability to locate the defect in three dimensions. To this end, two different methods were investigated; namely, frequency domain synthetic aperture focusing technique (FD-SAFT) and wide-band microwave holography. To illustrate the performance of these methods they were applied to two different SOFI samples. The results of these investigations demonstrate the capabilities of these methods for SOFI inspection.
Recommended Citation
J. T. Case et al., "Inspection of Spray on Foam Insulation (SOFI) using Microwave and Millimeter Wave Synthetic Aperture Focusing and Holography," Proceedings of the IEEE Instrumentation and Measurement Technology Conference (2006, Sorrento, Italy), pp. 2148 - 2153, Institute of Electrical and Electronics Engineers (IEEE), Apr 2006.
The definitive version is available at https://doi.org/10.1109/IMTC.2006.328527
Meeting Name
IEEE Instrumentation and Measurement Technology Conference (2006: Apr. 24-27, Sorrento, Italy)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Microwave Holography; Microwaves; Millimeter Waves; Synthetic Apertures; Air Voids; Spray On Foam Insulation (SOFI); Synthetic Aperture Focusing; Synthetic Focusing; Nondestructive Examination; Foam; Microwave; Millimeter Wave; Nondestructive Testing; SOFI
International Standard Book Number (ISBN)
978-0780393608
International Standard Serial Number (ISSN)
1091-5281
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2006 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Apr 2006