Abstract
Digital devices and discontinuities are typically analyzed by inserting their equivalent circuits into SPICE-type simulators. The partial element equivalent circuit method has been proven to be very useful for electromagnetic modeling. It can be used in both the time and the frequency domain. In this paper, the PEEC technique is employed as an efficient full-wave modeling tool to derive SPICE-type equivalent circuits of signal via transition structures. A nodal analysis technique is utilized in conjunction with the optimization algorithm to extract the equivalent circuits, whose component values are the parameters optimized. The good agreement between different approaches demonstrates that the proposed approach can be a powerful tool for deriving the equivalent circuits of signal via transitions.
Recommended Citation
J. Mao et al., "Extraction of SPICE-Type Equivalent Circuits of Signal Via Transitions using the PEEC Method," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2004, Santa Clara, CA), vol. 3, pp. 980 - 983, Institute of Electrical and Electronics Engineers (IEEE), Aug 2004.
The definitive version is available at https://doi.org/10.1109/ISEMC.2004.1349959
Meeting Name
IEEE International Symposium on Electromagnetic Compatibility (2004: Aug. 9-13, Santa Clara, CA)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
EMI; PEEC Method; SPICE; SPICE-Type Equivalent Circuit Extraction; Circuit Analysis Computing; Digital Devices; Electromagnetic Interference; Electromagnetic Modeling; Equivalent Circuits; Frequency Domain; Full-Wave Modeling Tool; Multi-Layer Printed Circuit Designs; Network Routing; Nodal Analysis Technique; Optimisation; Optimization Algorithm; Partial Element Equivalent Circuit; Printed Circuit Layout; Signal Integrity; Signal Line Routing; Signal Via Transitions; Time Domain; Circuit extraction; PEEC; Signal Integrity
International Standard Book Number (ISBN)
780384431
International Standard Serial Number (ISSN)
1077-4076
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2004 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2004