Abstract
A novel method to extract dispersive properties for dielectrics over a wide frequency range is proposed. This method is based on measuring scattering parameters for planar transmission lines and applying genetic algorithms. The scattering parameters are converted into ABCD matrix parameters. The complex propagation constant of the TEM wave inside the line is obtained from A-parameters of the ABCD matrix. For planar transmission lines, analytical or empirical formulas for dielectric loss,conductor loss, anaphase constant are known. The genetic algorithm is then used to extract the Debye parameters for the dielectric substrates. FDTD modeling is used to verify the dispersive parameter extraction by comparing with the measurement.
Recommended Citation
J. Zhang et al., "Extraction of Dispersive Material Parameters using Vector Network Analyzers and Genetic Algorithms," Proceedings of the IEEE Instrumentation and Measurement Technology Conference (2006, Sorrento, Italy), pp. 462 - 467, Institute of Electrical and Electronics Engineers (IEEE), Apr 2006.
The definitive version is available at https://doi.org/10.1109/IMTC.2006.328518
Meeting Name
IEEE Instrumentation and Measurement Technology Conference (2006: Apr. 24-27, Sorrento, Italy)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Debye Dispersion Law; S-Parameter Measurement; Conduction Loss; Dielectric Loss; Planar Structure Transmission Lines; Genetic Algorithm; Dielectric Losses; Electric Lines; Finite Difference Time Domain Method; Genetic Algorithms; Parameter Estimation; Vectors; Dispersive Material Parameters; Vector Network Analyzers; Dielectric Materials
International Standard Book Number (ISBN)
978-0780393608
International Standard Serial Number (ISSN)
1091-5281
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2006 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Apr 2006
