Abstract
Subcellular modeling of thin slots in the finite-difference time-domain (FDTD) method is investigated. Two subcellular algorithms for modeling thin slots with the FDTD method are compared for application to shielding end osures in electromagnetic compatibility (EMC). The stability of the algorithms is investigated, and comparisons between the two methods for slots in planes, and slots in loaded cavities are made. Results for scattering from a finite-length slot in an infinite plane employing one of the algorithms are shown to agree well with published experimental results, and power delivered to an enclosure with a slot agree well with results measured for this study.
Recommended Citation
K. Ma et al., "Comparison of FDTD Algorithms for Subcellular Modeling of Slots in Shielding Enclosures," IEEE Transactions on Electromagnetic Compatibility, vol. 39, no. 2, pp. 147 - 155, Institute of Electrical and Electronics Engineers (IEEE), May 1997.
The definitive version is available at https://doi.org/10.1109/15.584937
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
EM Radiation; EM Scattering; EMC; FDTD Algorithms; Algorithms Stability; Electromagnetic Compatibility; Electromagnetic Interference; Electromagnetic Shielding; Electromagnetic Wave Scattering; Experimental Results; Finite Difference Time Domain Method; Finite Difference Time-Domain Analysis; Finite-Length Slot; Infinite Plane; Loaded Cavities; Numerical Stability; Packaging; Power; Shielding Enclosures; Subcellular Algorithms; Subcellular Modeling; Thin Slots; FDTD; Slot; Boundary Conditions; Computer Simulation; Finite Difference Method; Stability; Time Domain Analysis; Absorbing Boundary Conditions; Finite Difference Time Domain Algorithms; Algorithms
International Standard Serial Number (ISSN)
0018-9375; 1558-187X
Document Type
Article - Journal
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 1997 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 May 1997