Abstract
Recently, a Clarke's model-based simulator was proposed for Rayleigh fading channels. However, that model, as shown in this paper, may encounter statistic deficiency. Therefore, an improved model is presented to remove the statistic deficiency. Furthermore, a new simulation model is proposed for Rician fading channels. This Rician fading simulator with finite number of sinusoids plus a zero-mean stochastic sinusoid as the specular (line-of-sight) component is different from all the existing Rician fading simulators, which have non-zero mean deterministic specular component. The statistical properties of the proposed Rayleigh and Rician fading channel models are analyzed in detail, which shows that these statistics either exactly match or quickly converge to the theoretically desired ones. Additionally and importantly, the probability density function of the Rician fading phase is not only independent from time but also uniformly distributed, which is fundamentally different from that of all the existing Rician fading models. The statistical properties of the new simulators are evaluated by numerical results, finding good agreement in all cases.
Recommended Citation
C. Xiao and Y. R. Zheng, "A Statistical Simulation Model for Mobile Radio Fading Channels," Proceedings of the IEEE Wireless Communications and Networking, 2003. WCNC 2003, Institute of Electrical and Electronics Engineers (IEEE), Jan 2003.
The definitive version is available at https://doi.org/10.1109/WCNC.2003.1200335
Meeting Name
IEEE Wireless Communications and Networking, 2003. WCNC 2003
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Rayleigh Channels; Rayleigh Fading Channel; Rician Channels; Rician Fading Channel; Rician Fading Simulator; Channel Simulators; Mobile Radio; Nonzero-Mean Deterministic; Probability Density Function; Specular Components; Statistical Analysis; Statistical Simulation Model; Zero-Mean Stochastic Sinusoid
International Standard Serial Number (ISSN)
1525-3511
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2003 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jan 2003