Abstract
A coupled transmission line model for narrow slot structures in DC power planes is proposed. This approach, combined with SPICE-based cavity models and a segmentation method, provides an easy and fast way to model relatively complex structures of power planes with narrow slots often used for isolation purposes. This approach is used to achieve isolation using gapping. The cavity model formulations for rectangular and isosceles right triangular segments are reviewed. The rationale of modeling the narrow slot as a three-conductor transmission line is described. The modeling results are shown and compared with the output of a full wave simulation tool, HFSS, and with experimental measurements.
Recommended Citation
L. Zhang et al., "A Circuit Approach to Model Narrow Slot Structures in a Power Bus," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2004, Santa Clara, CA), pp. 401 - 406, Institute of Electrical and Electronics Engineers (IEEE), Aug 2004.
The definitive version is available at https://doi.org/10.1109/ISEMC.2004.1349825
Meeting Name
IEEE International Symposium on Electromagnetic Compatibility (2004: Aug. 9-13, Santa Clara, CA)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
DC Power Planes; SPICE; Coupled Transmission Line Model; Digital Integrated Circuits; Gapping; Integrated Circuit Noise; Interference Suppression; Isolation; Isosceles Right Triangular Segments; Narrow Slot Structure Model; Network Analysis; Power Bus Noise Alleviation; Rectangular Segments; Three-Conductor Transmission Line; Transmission Line Theory; Coupling Circuits; Power Transmission Lines; Distributed Parameter Circuits; Frequency; Impedance; Circuit Simulation; Transmission Line Measurements; Cavity Resonators; Electromagnetic Compatibility
International Standard Book Number (ISBN)
780384431
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2004 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2004