Abstract
Segmental lumped circuits are derived from coupled transmission line model for a narrow slot on the power bus. Both electric and magnetic coupling are taken into account by distributed inductances and capacitances. Then a SPICE- compatible circuit model for the power bus with the narrow slot is proposed. In this model, the segmental lumped circuits are connected to the equivalent circuit, which is derived by a hybrid cavity model and segmentation method for irregular power/ground planes. The model is validated by comparing with the calculations of finite element method (FEM) for the self or mutual impedances of the two port networks located in the power bus.
Recommended Citation
G. Feng et al., "SPICE-Compatible Cavity and Transmission Line Model for Power Bus with Narrow Slots," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2007, Honolulu, HI), Institute of Electrical and Electronics Engineers (IEEE), Jul 2007.
The definitive version is available at https://doi.org/10.1109/ISEMC.2007.208
Meeting Name
IEEE International Symposium on Electromagnetic Compatibility (2007: Jul. 9-13, Honolulu, HI)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
SPICE; Cavity Resonators; Coupled Transmission Lines; Finite Element Analysis; Lumped Parameter Network; Circuit Modeling; Finite Element Method (FEM); Hybrid Cavity; International Symposium; Lumped Circuits; Narrow Slot; Power Bus; Segmentation Methods; Transmission Line Model; Two-Port Networks; Buses; Electric Inverters; Electric Lines; Electromagnetic Compatibility; Electromagnetic Wave Emission; Electromagnetism; Equivalent Circuits; Finite Element Method; Lumped Parameter Networks; Magnetic Couplings; Magnetic Materials; Materials Science; Networks (Circuits); Plastic Molds; Power Transmission; Technical Presentations; Transmission Line Theory; Coupled Circuits
International Standard Book Number (ISBN)
978-1424413508
International Standard Serial Number (ISSN)
2158-110X; 2158-1118
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2007 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jul 2007