Recommended Citation
T. Van Doren, "Probes for Diagnosing EMC Problems," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility, 2008. EMC 2008, Institute of Electrical and Electronics Engineers (IEEE), Aug 2008.
The definitive version is available at https://doi.org/10.1109/ISEMC.2008.4652194
Meeting Name
IEEE International Symposium on Electromagnetic Compatibility, 2008. EMC 2008
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Clamp-On Current Probes; Electric-Field Probes; Energy Coupling Mechanisms; Magnetic-Field Probes; Voltage Probes
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2008
