Abstract
A procedure is proposed for predicting TEM cell measurements from near field scans by modeling near-field scan data using equivalent sources. The first step in this procedure is to measure the tangential electric and magnetic fields over the circuit. Electric and magnetic fields are estimated from probe measurements by compensating for the characteristics of the probe. An equivalent magnetic and electric current model representing emissions is then generated from the compensated fields. These equivalent sources are used as an impressed source in an analytical formula or full wave simulation to predict measurements within the TEM cell. Experimental verification of the procedure using a microstrip trace and clock buffer show that values measured in the TEM cell and calculated from near field scan data agree within a few decibels from 1 MHz to 1 GHz.
Recommended Citation
H. Weng et al., "Predicting TEM Cell Measurements from Near Field Scan Data," Proceedings of the 2006 IEEE International Symposium on Electromagnetic Compatibility (2006, Portland, OR), Institute of Electrical and Electronics Engineers (IEEE), Aug 2006.
The definitive version is available at https://doi.org/10.1109/ISEMC.2006.1706371
Meeting Name
IEEE International Symposium on Electromagnetic Compatibility, EMC 2006 (2006: Aug. 14-18, Portland, OR)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
TEM Cell; Electromagnetic Emissions; Equivalent Source; Modeling; Near Field Measurement
International Standard Book Number (ISBN)
1-4244-0293-X
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2006 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2006
