Abstract
Near-field probes are often used to measure the electric and magnetic fields above a printed circuit board in order to identify the sources and coupling paths of an electromagnetic interference (EMI) problem. It is the objective of this paper to propose a rapid E-, Hx- Hy- and circular H-fields measurement using an orthogonal loops probe design. The effects of this probe are analyzed using full-wave simulations and measurements.
Recommended Citation
T. Li et al., "Orthogonal Loops Probe Design and Characterization for Near-Field Measurement," Proceedings of the 2005 International Symposium on Electromagnetic Compatibility, 2008. EMC 2008, Institute of Electrical and Electronics Engineers (IEEE), Aug 2008.
The definitive version is available at https://doi.org/10.1109/ISEMC.2008.4652138
Meeting Name
2005 International Symposium on Electromagnetic Compatibility, 2008. EMC 2008
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Electromagnetic Interference; Orthogonal Loops; Phase Shifting
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2008
