Abstract
More than one million people are diagnosed with skin cancer each year in the United States and more than ten thousand people die from the disease. Currently, there are some methods for early detection of skin cancers, like visual inspection, but improvements are needed. This paper presents a method involving microwave reflectometry as a diagnostic tool for detection of skin cancers. The results of measurements and simulations for normal and wet skin have been shown to distinguish among skin samples with different properties. Microwave measurements from lesions have also been presented which are used to distinguish between cancerous and benign lesions.
Recommended Citation
K. Chand et al., "Microwave Reflectometry as a Novel Diagnostic Method for Detection of Skin Cancers," Proceedings of the 22nd IEEE Instrumentation and Measurement Technology Conference (2005: Ottawa, Ontario, Canada), vol. 2, pp. 1425 - 1428, Institute of Electrical and Electronics Engineers (IEEE), May 2005.
The definitive version is available at https://doi.org/10.1109/IMTC.2005.1604385
Meeting Name
22nd IEEE Instrumentation and Measurement Technology Conference (2005: May 16-19, Ottawa, Ontario, Canada)
Department(s)
Electrical and Computer Engineering
Second Department
Chemistry
Keywords and Phrases
Basal Cell Carcinoma; Melanoma; Microwave Reflectometry; Relaxation Frequency
International Standard Book Number (ISBN)
978-0780388796
International Standard Serial Number (ISSN)
1091-5281
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2005 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 May 2005
