Abstract
The results of measurement and monitoring of reflection and transmission properties of cement-based specimens (blocks of mortar, concrete) obtained by using a simple and an inexpensive measurement system at microwave frequencies (X-band) are presented. Dependencies of the reflection and transmission coefficients on water-to-cement (w/c) ratio, preparing and curing conditions of the specimens are demonstrated. It is shown that the amplitudes of reflection and transmission coefficients, together with thickness of the specimens, determine the complex dielectric permittivity of the hardened cement-based specimens. The expected applications of the results for the determination of physical properties of cement-based materials are discussed. The causes and effects of measurement errors and uncertainties are also discussed.
Recommended Citation
S. Kharkovsky et al., "Measurement and Monitoring of Microwave Reflection and Transmission Properties of Cement-Based Specimens," IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers (IEEE), Jan 2002.
The definitive version is available at https://doi.org/10.1109/TIM.2002.808081
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
X-Band Measurement System; Cement-Based Specimens; Cements (Building Materials); Complex Dielectric Permittivity; Concrete; Condition Monitoring; Curing; Curing Conditions; Hardened Cement-Based Specimens; Measurement Errors; Measurement Uncertainties; Measurement Uncertainty; Microwave Measurement; Microwave Reflection; Microwave Reflectometry; Microwave Transmission Properties; Monitoring; Mortar Blocks; Permittivity Measurement; Physical Properties; Preparing Conditions; Reflection Coefficients; Specimen Thickness; Transmission Coefficients; Water-To-Cement Ratio
International Standard Serial Number (ISSN)
0018-9456
Document Type
Article - Journal
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2002 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jan 2002