Abstract
The results of measurement and monitoring of reflection and transmission properties of cement-based specimens (blocks of mortar, concrete) during long time of their service lives, including hydration process, and different curing conditions at microwave frequencies (X-band) are presented. A simple and inexpensive measurement system that utilizes the nondestructive and contactless free space method is used. Dependencies of the reflection and transmission coefficients on water-to-cement ratio, preparing and curing conditions of the specimens are demonstrated. It is shown that the reflection coefficient is approximately stable after hydration process while the transmission coefficient changes during long time of the specimen''s service life. The complex dielectric permittivity of the cement-based materials is calculated by a new method using only the amplitudes of the reflection and transmission coefficients. The expected applications of the results are discussed.
Recommended Citation
S. Kharkovsky et al., "Measurement and Monitoring of Microwave Reflection and Transmission Properties of Cement-Based Specimens," Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference, 2001. IMTC 2001, Institute of Electrical and Electronics Engineers (IEEE), Jan 2001.
The definitive version is available at https://doi.org/10.1109/IMTC.2001.928872
Meeting Name
18th IEEE Instrumentation and Measurement Technology Conference, 2001. IMTC 2001
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
X-Band Frequency; Blocks of Mortar; Cement-Based Specimens; Cements (Building Materials); Complex Dielectric Permittivity; Concrete; Different Curing Conditions; Hydration Process; Microwave Measurement; Microwave Reflection Properties; Microwave Transmission Properties; Moisture Measurement; Nondestructive Contactless Free Space Method; Permittivity Measurement; Process Monitoring; Solvation; Water Content; Water-To-Cement Ratio
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2001 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jan 2001