Doctoral Dissertations

Jayong Koo

Abstract

"The exposure of electronic circuits to lightning, electrostatic discharge (ESD), electrical fast transients (EFT) or sine wave signals can reveal RF immunity problems. Typical problems include temporary malfunctions or permanent damage of integrated circuits (ICs). In an effort to reproduce those disturbances, a series of electromagnetic compatibility standards has been developed. However, a complete understanding of the root cause of the immunity problems has yet to be established. This dissertation discusses immunity problems in three papers, starting at the system level, via the coupling path into the IC"--Abstract, page iv.

Advisor(s)

Pommerenke, David

Committee Member(s)

Beetner, Daryl G.
DuBroff, Richard E.
OKeefe, Matt
Drewniak, James L.

Department(s)

Electrical and Computer Engineering

Degree Name

Ph. D. in Electrical Engineering

Publisher

Missouri University of Science and Technology

Publication Date

Fall 2008

Journal article titles appearing in thesis/dissertation

  • Correlation between EUT failure levels and ESD generator parameters
  • Frequency domain measurement method for the analysis of ESD generators and coupling
  • Non-linear [Greek character for mu]-controller power distribution network model for characterization of immunity to EFTS

Pagination

xiii, 102 pages

Note about bibliography

Includes bibliographical references.

Rights

© 2008 Ja Yong Koo, All rights reserved.

Document Type

Dissertation - Open Access

File Type

text

Language

English

Subject Headings

Electric dischargesElectric power system stabilityElectromagnetic compatibility -- Standards

Thesis Number

T 9457

Print OCLC #

352926920

Electronic OCLC #

244252067

Download

Share

 
COinS