Doctoral Dissertations
Abstract
"The exposure of electronic circuits to lightning, electrostatic discharge (ESD), electrical fast transients (EFT) or sine wave signals can reveal RF immunity problems. Typical problems include temporary malfunctions or permanent damage of integrated circuits (ICs). In an effort to reproduce those disturbances, a series of electromagnetic compatibility standards has been developed. However, a complete understanding of the root cause of the immunity problems has yet to be established. This dissertation discusses immunity problems in three papers, starting at the system level, via the coupling path into the IC"--Abstract, page iv.
Advisor(s)
Pommerenke, David
Committee Member(s)
Beetner, Daryl G.
DuBroff, Richard E.
OKeefe, Matt
Drewniak, James L.
Department(s)
Electrical and Computer Engineering
Degree Name
Ph. D. in Electrical Engineering
Publisher
Missouri University of Science and Technology
Publication Date
Fall 2008
Journal article titles appearing in thesis/dissertation
- Correlation between EUT failure levels and ESD generator parameters
- Frequency domain measurement method for the analysis of ESD generators and coupling
- Non-linear [Greek character for mu]-controller power distribution network model for characterization of immunity to EFTS
Pagination
xiii, 102 pages
Note about bibliography
Includes bibliographical references.
Rights
© 2008 Ja Yong Koo, All rights reserved.
Document Type
Dissertation - Open Access
File Type
text
Language
English
Subject Headings
Electric discharges
Electric power system stability
Electromagnetic compatibility -- Standards
Thesis Number
T 9457
Print OCLC #
352926920
Electronic OCLC #
244252067
Link to Catalog Record
Recommended Citation
Koo, Jayong, "System and IC level analysis of electrostatic discharge (ESD) and electrical fast transient (EFT) immunity and associated coupling mechanisms" (2008). Doctoral Dissertations. 2287.
https://scholarsmine.mst.edu/doctoral_dissertations/2287
