Top-K with Diversity-M Data Retrieval in WSNs
Top-K with Diversity-M Data Retrieval in Wireless Sensor Networks
In applications of Wireless Sensor Networks (WSNs) such as monitoring chemical leaks in case of a disaster, a user may be interested in getting top-k with diversity-m (referred as Top (k, m)), that is, top-k data should come from m different sub-regions (clusters) to simultaneously monitor critical areas. In addition, one may also monitor values for persistency, how long the top-k values remain unchanged. In this paper, we have introduced the new problem of continuous top-k query with diversity-m, i.e., we want to find the k highest values from at least m different clusters over a period of time in a WSN. In this context, we introduce an energy efficient scheme Top (k, m) to utilize the Gaussian's probability function to estimate the probability of a sensor node value being in the final top-k set. Based on the probability, the node decides whether to forward data values to the base station or not. Moreover, we make sure that top-k data items are not only collected from m-clusters, but they are also persistency, which is helpful in real-time monitoring applications. We have shown the improved performance of our scheme with respect to recent schemes EXTOK and Grid in terms of communication, energy usage and network life-time.
K. K. Puram and S. K. Madria, "Top-K with Diversity-M Data Retrieval in WSNs," Proceedings of the 17th IEEE International Conference on Mobile Data Management (2016, Porto, Portugal), Institute of Electrical and Electronics Engineers (IEEE), Jul 2016.
The definitive version is available at https://doi.org/10.1109/MDM.2016.22
17th IEEE International Conference on Mobile Data Management, MDM (2016: Jun. 13-16, Porto, Portugal)
Intelligent Systems Center
Keywords and Phrases
Base stations; Standards; Monitoring; Wireless sensor networks; Clustering algorithms; Approximation algorithms; Temperature sensors
International Standard Book Number (ISBN)
International Standard Serial Number (ISSN)
Article - Conference proceedings
© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
16 Jul 2016