Mitosis Detection for Stem Cell Tracking in Phase-Contrast Microscopy Images
Automated visual-tracking systems of stem cell populations in vitro allow for high-throughput analysis of time-lapse phase-contrast microscopy. In these systems, detection of mitosis, or cell division, is critical to tracking performance as mitosis causes branching of the trajectory of a mother cell into the two trajectories of its daughter cells. Recently, one mitosis detection algorithm showed its success in detecting the time and location that two daughter cells first clearly appear as a result of mitosis. This detection result can therefore helps trajectories to correctly bifurcate and the relations between mother and daughter cells to be revealed. In this paper, we demonstrate that the functionality of this recent mitosis detection algorithm significantly improves state-of-the-art cell tracking systems through extensive experiments on 48 C2C12 myoblastic stem cell populations under four different conditions.
S. Huh et al., "Mitosis Detection for Stem Cell Tracking in Phase-Contrast Microscopy Images," Proceedings of the International Symposium on Biomedical Imaging (2011, Chicago, IL), pp. 2121-2127, Institute of Electrical and Electronics Engineers (IEEE), Mar 2011.
The definitive version is available at https://doi.org/10.1109/ISBI.2011.5872832
International Symposium on Biomedical Imaging (2011: Mar. 30-Apr. 2, Chicago, IL)
Keywords and Phrases
Cell Divisions; Cell Images; Cell Lineage; Cell Populations; Cell Tracking; Cell Tracking System; Daughter Cells; High-throughput Analysis; In-Vitro; Mitosis Detections; Phase-contrast Microscopy; Stem Cell Tracking; Tracking Performance; Algorithms; Cell Culture; Cell Proliferation; Medical Imaging; Signal Detection; Tracking (Position); Trajectories; Stem Cells; cell Image Analysis; Cell Lineage Construction; Mitosis Detection
International Standard Book Number (ISBN)
International Standard Serial Number (ISSN)
Article - Conference proceedings
© 2011 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.