FTK: A Simplicial Spacetime Meshing Framework for Robust and Scalable Feature Tracking
We present the Feature Tracking Kit (FTK), a framework that simplifies, scales, and delivers various feature-tracking algorithms for scientific data. The key of FTK is our high-dimensional simplicial meshing scheme that generalizes both regular and unstructured spatial meshes to spacetime while tessellating spacetime mesh elements into simplices. The benefits of using simplicial spacetime meshes include (1) reducing ambiguity cases for feature extraction and tracking, (2) simplifying the handling of degeneracies using symbolic perturbations, and (3) enabling scalable and parallel processing. The use of simplicial spacetime meshing simplifies and improves the implementation of several feature-tracking algorithms for critical points, quantum vortices, and isosurfaces. As a software framework, FTK provides end users with VTK/ParaView filters, Python bindings, a command line interface, and programming interfaces for feature-tracking applications. We demonstrate use cases as well as scalability studies through both synthetic data and scientific applications including Tokamak, fluid dynamics, and superconductivity simulations. We also conduct end-to-end performance studies on the Summit supercomputer. FTK is open-sourced under the MIT license: https://github.com/hguo/ftk.
H. Guo et al., "FTK: A Simplicial Spacetime Meshing Framework for Robust and Scalable Feature Tracking," IEEE Transactions on Visualization and Computer Graphics, vol. 27, no. 8, pp. 3463-3480, Institute of Electrical and Electronics Engineers (IEEE), Aug 2021.
The definitive version is available at https://doi.org/10.1109/TVCG.2021.3073399
Intelligent Systems Center
Keywords and Phrases
Critical Points; Distributed and Parallel Processing; Faces; Feature Extraction; Feature Tracking; Isosurfaces; Isosurfaces; Parallel Processing; Spacetime Meshing; Three-Dimensional Displays; Topology; Tracking; Vortices
International Standard Serial Number (ISSN)
Article - Journal
© 2021 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Aug 2021