Cross-sectional Scanning Tunneling Microscopy of Electrodeposited Metal Oxide Superlattices
Abstract
We have used scanning tunneling microscopy to characterize cleaved cross sections of Pb-Tl-O superlattices. The metal oxide ceramic superlattices were electrodeposited from a single solution, with layer thicknesses as small as 1.5 nm. The lattice parameter of the fcc fluorite-type oxides is approximately 0.536 nm. Modulation wavelengths were determined using Fourier analysis of the STM images and found to be in good agreement with Faraday calculations and x-ray diffraction measurements. The STM is especially well suited for the measurement of modulation wavelengths that are too large to measure by x-ray diffraction, but too small to measure by scanning electron microscopy.
Recommended Citation
T. D. Golden et al., "Cross-sectional Scanning Tunneling Microscopy of Electrodeposited Metal Oxide Superlattices," Applied Physics Letters, American Institute of Physics (AIP), Jan 1993.
The definitive version is available at https://doi.org/10.1063/1.109669
Department(s)
Chemistry
International Standard Serial Number (ISSN)
0003-6951
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 1993 American Institute of Physics (AIP), All rights reserved.
Publication Date
01 Jan 1993
