Cross-sectional Scanning Tunneling Microscopy of Electrodeposited Metal Oxide Superlattices

Author

Teresa D. Golden
Ryne P. Raffaelle
Jay A. Switzer, Missouri University of Science and TechnologyFollow

Abstract

We have used scanning tunneling microscopy to characterize cleaved cross sections of Pb-Tl-O superlattices. The metal oxide ceramic superlattices were electrodeposited from a single solution, with layer thicknesses as small as 1.5 nm. The lattice parameter of the fcc fluorite-type oxides is approximately 0.536 nm. Modulation wavelengths were determined using Fourier analysis of the STM images and found to be in good agreement with Faraday calculations and x-ray diffraction measurements. The STM is especially well suited for the measurement of modulation wavelengths that are too large to measure by x-ray diffraction, but too small to measure by scanning electron microscopy.

Recommended Citation

T. D. Golden et al., "Cross-sectional Scanning Tunneling Microscopy of Electrodeposited Metal Oxide Superlattices," Applied Physics Letters, American Institute of Physics (AIP), Jan 1993.

The definitive version is available at https://doi.org/10.1063/1.109669

Department(s)

Chemistry

International Standard Serial Number (ISSN)

0003-6951

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 1993 American Institute of Physics (AIP), All rights reserved.

Publication Date

01 Jan 1993