Real-space Imaging of Nanoscale Electrodeposited Ceramic Superlattices in the Scanning Tunneling Microscope
We have imaged fractured cross-sections of electrodeposited ceramic oxides based on the Tl-Pb-O system using a scanning tunneling microscope. The goal of this work is to measure both the modulation wavelength and compositional profile of the superlattices by mapping out the electronic properties in real space on a nanometer scale. Fourier analysis was done on STM images of all superlattices to yield the modulation wavelength. The modulation wavelength from STM was then compared with those obtained by Faraday calculation and x-ray diffraction. The STM can be used to design `better' superlattices. We have found that the composition profile in superlattices deposited by modulating the potential was more square than in superlattices deposited by modulating the current.
T. D. Golden et al., "Real-space Imaging of Nanoscale Electrodeposited Ceramic Superlattices in the Scanning Tunneling Microscope," Materials Research Society Symposium - Proceedings, Materials Research Society, Jan 1993.
Materials Research Society Symposium Proceedings (1993, Boston, MA, USA)
Article - Conference proceedings
© 1993 Materials Research Society, All rights reserved.
01 Jan 1993