Correlation between Growth Conditions, Microstructure, and Optical Properties in Pulsed-laser-deposited V₂O₅ Thin Films

Abstract

V₂O₅ thin films were prepared by pulsed laser deposition (PLD) over a wide substrate temperature range, 30-500 °C, and were characterized by studying their microstructure and optical properties. Rutherford backscattering spectrometry (RBS), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), and UV-vis-NIR spectral measurements were made on the PLD V₂O₅ films to understand the effect of substrate temperature on the chemical composition, elemental distribution, surface morphology, and optical properties. the substrate temperature strongly influences the structure and optical properties of PLD V₂O₅ films and a correlation exists between the growth conditions, grain structure, and optical characteristics.The grain size increased, associated with a change in surface morphology, with increasing substrate temperature. the optical energy band gap of PLD V₂O₅ films is strongly dependent on the substrate temperature and decreased from 2.47 to 2.12 eV with the increase in temperature from 30 to 500 °C.

Department(s)

Chemistry

Sponsor(s)

National Science Foundation (U.S.)
Petroleum Research Fund

International Standard Serial Number (ISSN)

0897-4756

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2005 American Chemical Society (ACS), All rights reserved.

Publication Date

01 Feb 2005

Link to Full Text

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