X-Ray Characterization of As-Deposited, Epitaxial Films of Bi(0 1 2) on Au(1 1 1)

Author

Craig A. Jeffrey
Susan H. Zheng
Eric Bohannan, Missouri University of Science and TechnologyFollow
David A. Harrington
Sylvie Morin

Abstract

Electrodeposition is used to produce epitaxial single-crystal films on Au(1 1 1) substrates without annealing or other post-deposition modification. X-ray techniques show that the Bi(0 1 2) plane is parallel to the underlying Au(1 1 1) surface, and the azimuthal orientation of the films is determined. Combination of the X-ray data with in situ scanning tunneling microscopy (STM) images suggests a common growth mode from the first few layers up to thick films. © 2005 Elsevier B.V. All rights reserved.

Recommended Citation

C. A. Jeffrey et al., "X-Ray Characterization of As-Deposited, Epitaxial Films of Bi(0 1 2) on Au(1 1 1)," Surface Science, vol. 600, no. 1, pp. 95 - 105, Elsevier, Jan 2006.

The definitive version is available at https://doi.org/10.1016/j.susc.2005.09.050

Department(s)

Chemistry

Comments

Ontario Innovation Trust, Grant None

Keywords and Phrases

Bismuth; Electrodeposition; Epitaxy; Film growth; Scanning tunneling microscopy; Surface structure; X-ray methods

International Standard Serial Number (ISSN)

0039-6028

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2024 Elsevier, All rights reserved.

Publication Date

01 Jan 2006