Epitaxial Electrodeposition of High-aspect-ratio Cu₂O(110) Nanostructures on InP(111)
Abstract
Epitaxial cuprous oxide nanostructures with high aspect ratio were deposited electrochemically on n-InP(111) from aqueous solution at room temperature. High-resolution X-ray diffraction shows that the Cu2O and InP form three equivalent epitaxial orientation relationships that are rotated 120 relative to each other: Cu2O(110)[100] || InP(111)[10], Cu2O(110)[100] || InP(111)[01], and Cu2O(110)[100] || InP(111)[01]. the size and aspect ratio of the Cu2O nanostructures depend on the applied deposition current density. at a deposition current density of 0.125 mA/cm2, uniformly sized nanostructures 30 nm wide and 1000 nm long were obtained. Transmission electron microscopy reveals an amorphous, oxygen-rich interlayer and a crystalline Cu3P layer between the Cu2O and InP.
Recommended Citation
R. Liu et al., "Epitaxial Electrodeposition of High-aspect-ratio Cu₂O(110) Nanostructures on InP(111)," Chemistry of Materials, vol. 17, no. 4, pp. 725 - 729, American Chemical Society (ACS), Jan 2005.
The definitive version is available at https://doi.org/10.1021/cm048296l
Department(s)
Chemistry
Sponsor(s)
Case Alumni Association
Case School of Engineering
National Science Foundation (U.S.)
United States. Department of Energy
Keywords and Phrases
Epitaxy; Nanostructures
International Standard Serial Number (ISSN)
0897-4756
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2005 American Chemical Society (ACS), All rights reserved.
Publication Date
01 Jan 2005