Abstract
We study the dependence of the production of binary encounter electrons on the charge state of recoil ions for 2.4 MeV u-l Xe21+ on He and Ar. Doubly differential cross sections of electron emission are calculated with the ncrMC method. We find that the contributions to the binary electron cross section from various recoil ion charge states reach a maximum near Ar5+ for the Ar target. In the case of the He target; double ionization dominates over single ionization for alt ejected electron energies above 100 eV. However, an unexpected local drop of double ionization in the binary peak region has been observed. This decrease is found to be related to a two-step, sequential removal of the two electrons. © 1993 IOP Publishing Ltd.
Recommended Citation
J. Wang et al., "Dependence Of Binary Encounter Electron Production On The Charge State Of The Recoil Ion," Journal of Physics B: Atomic, Molecular and Optical Physics, vol. 26, no. 15, pp. 457 - 463, IOP Publishing, Aug 1993.
The definitive version is available at https://doi.org/10.1088/0953-4075/26/15/005
Department(s)
Chemical and Biochemical Engineering
Second Department
Physics
International Standard Serial Number (ISSN)
1361-6455; 0953-4075
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2023 IOP Publishing, All rights reserved.
Publication Date
14 Aug 1993
