A Rigidity Detection System for the Guilty Knowledge Test

Author

Nathan W. Twyman, Missouri University of Science and TechnologyFollow
Aaron C. Elkins
Judee K. Burgoon

Recommended Citation

Twyman, N. W., Elkins, A. C., & Burgoon, J. K. (2011). A Rigidity Detection System for the Guilty Knowledge Test. Proceedings of the 44th Annual Hawaii International Conference on Systems Sciences (2011, Koloa, Hawaii) Hawaii International Conference on System Sciences (HICSS).

Meeting Name

44th Annual Hawaii International Conference on Systems Sciences, HICSS-44 , (2011: Jan. 4-7, Koloa, Hawaii)

Department(s)

Business and Information Technology

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2011 Hawaii International Conference on System Sciences (HICSS), All rights reserved.

Publication Date

01 Jan 2011