Title

Angular and Polarization Analysis of X-Rays Emitted from Highly-Charged, Few-Electron Ions

Abstract

The recent theoretical progress in studying the x-ray emission from highly-charged, few-electron ions is reviewed. These case studies show that relativistic, high-Z ions provide a unique tool for better understanding the interplay between the electron-photon and electron-electron interactions in strong fields. Most naturally, this interplay is probed by the radiative capture of a (quasi-) free electron into the bound states of projectile ions, and by varying the charge state and the energy of the projectiles. For the capture into initially hydrogen-and lithium-like ions, here we summarize the recent results for the angular distribution and polarization of the recombination photons as well as the subsequent Kα emission, if the electron is captured into an excited state of the ion.

Meeting Name

XXV International Conference on Photonic, Electronic and Atomic Collisions (2007: Jul. 25-31, Freiburg, Germany)

Department(s)

Physics

International Standard Serial Number (ISSN)

1742-6588

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2007 IOP Publishing, All rights reserved.


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