Keywords and Phrases
"Often Electromagnetic Interference (EMI) scanning applications require phase and magnitude information for the creation of equivalent radiation models and for far-field predictions. Magnitude information can be obtained using a spectrum analyzer (SA), which is relatively inexpensive compared to phase resolving instruments such as oscilloscopes (scope) and vector network analyzers (VNA). The study focusses on the development of a near-field scanning method using a SA to measure the phase of the device under test (DUT) signals.
The first part deals with the development of the method in software simulation tools and testing it under standard test conditions. The second part deals with the assembly of the measurement components - phase shifting cables, switches, attenuators and combiners. The measurement method is demonstrated by measuring the phase of the known signal. In the third part the measurement method is tested on a DUT having near field radiating sources. The measurements are performed and compared to the existing methods. This study introduces and optimizes SA based phase measurements and compares the results to oscilloscope and VNA based methods for sine waves and real EMI signals"--Abstract, page iii.
Fan, Jun, 1971-
Beetner, Daryl G.
Electrical and Computer Engineering
M.S. in Electrical Engineering
Missouri University of Science and Technology
x, 48 pages
© 2017 Shubhankar Marathe
Thesis - Open Access
Electronic OCLC #
Marathe, Shubhankar, "Spectrum analyzer based phase measurement for EMI scanning applications" (2017). Masters Theses. 7651.