"This paper presents an algorithm for deriving an optimum test sequence for detecting faults in a synchronous machine. In this study, the flow table is used as a tool to generate the fault detection tests. The fault stuck-at-1 (or stuck-at-0 ) is said to be present when a permanent signal valued 1 (or 0) appears on a component of the machine. Only single faults are treated . The result of the procedure is one or more test sequences guaranteed to detect a set of faults (Fp). First, sequential machines with feedback lines as memory elements are considered . Then the memory elements are changed to R-S flip-flops. Finally, several suggestions for further work are made"--Abstract, Page ii.
Szygenda, Stephen A.
Tracey, James H.
Ho, C. Y. (Chung You), 1933-1988
Electrical and Computer Engineering
M.S. in Electrical Engineering
University of Missouri--Rolla
viii, 62 Pages
© 1970 Chung-tao David Wang, All rights reserved.
Thesis - Open Access
Library of Congress Subject Headings
Electronic digital computers
Sequential machine theory
Print OCLC #
Electronic OCLC #
Link to Catalog Recordhttp://laurel.lso.missouri.edu/record=b1067207~S5
Wang, Chung-Tao David, "Fault detection on sequential machines" (1970). Masters Theses. 7063.