Abstract

Near-field scanning systems are a tool for rootcause ESD, EMI, and immunity analysis of electronic systems, as well as qualification methodology for ICs and modules. For emissions, they have developed into a standardized method. Development of universally accepted file formats for data exchange is on-going. Four main types of scanning have been implemented by this and other authors: Near-field EMI scanning, ESD scanning, radiated immunity scanning, and resonance scanning. This article concentrates on resonance scanning as a newly added method for automated EMC system analysis.

Meeting Name

IEEE International Symposium on Electromagnetic Compatibility (2008: Sep. 8-12, Hamburg, Germany)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Resonance; Electromagnetic Interference; Immunity Testing; Coupling Circuits; Electromagnetic Compatibility; Electrostatic Discharge; Integrated Circuit Noise; Clocks; Cables; Frequency; EMI; Near Field Scanning; ESD; Data Exchanges; Electronic Systems; File Formats; Immunity Analysis; Near Field Scanning; Near Fields; Standardized Methods; System Analysis; Electric Inverters; Electromagnetic Pulse; Electrostatic Devices; Plastic Molds; Resonance; Scanning

International Standard Book Number (ISBN)

978-1424427376

International Standard Serial Number (ISSN)

2325-0356; 2325-0364

Document Type

Article - Conference proceedings

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Sep 2008

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