Title

Application of the Dual-Loaded Modulated Scatterer Technique to Multilayered Material Evaluation

Abstract

Health monitoring of infrastructure is an important concern. There are a number of nondestructive testing techniques that have been developed for this purpose. Embedded Modulated Scatterer Technique (MST) is one such method. This paper presents embedded MST, utilizing a dual-loaded scatterer, as applied to multilayer structure assessment. Simulation and measurement results are provided.

Meeting Name

IEEE International Instrumentation and Measurement Technology Conference (2011: May 10-12, Binjiang, Hangzhou, China)

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Embedded Sensors; Loaded Scatterer; Materials Characterization; Microwave Nondestructive Testing; Modulated Scatterer; Directional Patterns (Antenna); Elastic Constants; Instruments; Measurement Theory; Nondestructive Examination; Scattering; Embedded Sensor; Modulated Scatterer Technique

International Standard Book Number (ISBN)

9781424479351

International Standard Serial Number (ISSN)

1091-5281

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2011 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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