Abstract

During immunity testing (ESD, EFT) of a digital circuit, the waveforms of critical signal nets need to be measured for analyzing the failure mechanism. However, it is difficult to measure the induced voltage in the circuit under test due to the unwanted coupling by the non-ideal shielding of the probe cable, especially, if large common mode currents are present. Fiber optical connection avoids this problem. Semiconductor lasers have frequently been used for converting the voltage into an optical signal. The paper shows novel implementations of powering the laser, leading to a small, low cost optical probe.

Meeting Name

2006 IEEE International Symposium on Electromagnetic Compatibility, 2006

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

EM Coupling; Non-Ideal Shielding; Optical Link; Susceptibility Test

Document Type

Article - Conference proceedings

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2006 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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