Abstract

A novel method to extract dispersive properties for dielectrics over a wide frequency range is proposed. This method is based on measuring scattering parameters for planar transmission lines and applying genetic algorithms. The scattering parameters are converted into ABCD matrix parameters. The complex propagation constant of the TEM wave inside the line is obtained from A-parameters of the ABCD matrix. For planar transmission lines, analytical or empirical formulas for dielectric loss, conductor loss, and phase constant are known. The genetic algorithm is then used to extract the Debye parameters for the dielectric substrates. FDTD modeling is used to verify the dispersive parameter extraction by comparing with the measurement.

Meeting Name

IEEE Instrumentation and Measurement Technology Conference, 2006

Department(s)

Electrical and Computer Engineering

Second Department

Physics

Keywords and Phrases

Debye Dispersion Law; S-Parameter Measurement; Conduction Loss; Dielectric Loss; Planar Structure Transmission Lines

Library of Congress Subject Headings

enetic algorithms

Document Type

Article - Conference proceedings

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2006 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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