A novel method to extract dispersive properties for dielectrics over a wide frequency range is proposed. This method is based on measuring scattering parameters for planar transmission lines and applying genetic algorithms. The scattering parameters are converted into ABCD matrix parameters. The complex propagation constant of the TEM wave inside the line is obtained from A-parameters of the ABCD matrix. For planar transmission lines, analytical or empirical formulas for dielectric loss, conductor loss, and phase constant are known. The genetic algorithm is then used to extract the Debye parameters for the dielectric substrates. FDTD modeling is used to verify the dispersive parameter extraction by comparing with the measurement.
J. Zhang et al., "Extraction of Dispersive Material Parameters Using Vector Network Analyzers and Genetic Algorithms," Proceedings of the IEEE Instrumentation and Measurement Technology Conference, 2006, Institute of Electrical and Electronics Engineers (IEEE), Jan 2006.
The definitive version is available at http://dx.doi.org/10.1109/IMTC.2006.328518
IEEE Instrumentation and Measurement Technology Conference, 2006
Electrical and Computer Engineering
Keywords and Phrases
Debye Dispersion Law; S-Parameter Measurement; Conduction Loss; Dielectric Loss; Planar Structure Transmission Lines
Library of Congress Subject Headings
Article - Conference proceedings
© 2006 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.