Abstract

Integrated circuits (ICs) are often a significant source of radiated energy from electronic systems. Near-field magnetic scanning is an effective tool for measuring the current distribution in IC packages and investigating chiplevel EMI problems. This paper discusses analysis of near-magnetic field scan data using tangential and normal field measurements. Results show that combining near-field scan results from probes with multiple orientations is an effective way to identify the current paths in IC packages. © 2005 IEEE.

Meeting Name

2005 International Symposium on Electromagnetic Compatibility, EMC 2005 (2005: Aug. 8-12, Chicago, IL)

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

EMI; IC; Near-field Magnetic Scanning; VLSI

International Standard Book Number (ISBN)

0-7803-9380-5

International Standard Serial Number (ISSN)

2158-110X

Document Type

Article - Conference proceedings

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2005 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Share

 
COinS