The use of combined embedded modulated scattering technique and near-field microwave nondestructive testing techniques is investigated as a novel method for evaluating the dielectric properties of a material. The forward formulation for determining the reflection coefficient at the aperture of a waveguide radiating into a dielectric half-space in which a PIN diode-loaded dipole (i.e., modulated scattering technique probe) is embedded was presented in Part I of this paper. Here, in Part II, the recalculation of the dielectric properties, using the results of the forward model, is presented along with some associated experimental results.


Electrical and Computer Engineering

Keywords and Phrases

Dielectric Material Characterization; PIN Diode-Loaded Dipole; Dielectric Half-Space; Dielectric Material Characterization; Dielectric Material Property; Dielectric Materials; Dielectric Measurement; Dielectric Properties; Dielectric Property Recalculation; Electromagnetic Wave Reflection; Electromagnetic Wave Scattering; Embedded Modulated Scattering; Embedded Sensors; Forward Formulation; Forward Model; Microwave Measurement; Microwave Nondestructive Testing; Modulated Scattering Technique; Near-Field Microwave Nondestructive Testing; Nondestructive Testing; Reflection Coefficient; Waveguide Aperture; Electromagnetic Formulation-Probe Development and Antennas; Material Characterization

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Document Type

Article - Journal

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Final Version

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© 2005 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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